Japan Traceability Committee Liaison Report R 0 NA Spring Meetings 2012
Outline • • Leadership Organization Chart Meeting Information Ballot Results New TFOF/SNARF Upcoming Ballot TF reports Schedule for SEMICON Japan 2010 <Month> <Year> <Region> <Committee> 2
Leadership • Committee Co-chairs – Yoichi Iga (Renesas Electronics) – Hirokazu Tsunobuchi (Keyence) <Month> <Year> <Region> <Committee> 3
Organization Chart Traceability Committee Yoichi Iga (Renesas Electronics) Hirokazu Tsunobuchi (keyence) Device Marking TF Yoichi Iga (Renesas Electronics) Hirokazu Tsunobuchi (Keyence) JIG and Unit Package ID TF Hirokazu Tsunobuchi (Keyence) Japan PV Traceability TF Yoichi Iga (Renesas Electronics) Hirokazu Tsunobuchi (Keyence) Device Security TF Yoichi Iga (Renesas Electronics) Atsushi Ohwada (Adem) Hirokazu Tsunobuchi (Keyence) Japan Anti-Counterfeiting TF Yoichi Iga (Renesas Electronics) Atsushi Ohwada (Adem) Hirokazu Tsunobuchi (Keyence) 5 Year Review TF Kazuhiro Tsunobuchi (Keyence)
Meeting Information • Last meeting – 7 December, 2011 • SEMICON Japan 2011, Makuhari Messe, Chiba, Japan • Next meeting – 26 April, 2012 • SEMI Japan, Tokyo, Japan <Month> <Year> <Region> <Committee> 5
Ballot Results • Doc. 4845 A, New Standard: Specification for Organization Identification by Digital Certificate Issued from Certificate Service Body (CSB) for Anticounterfeiting Traceability in Components Supply Chain – Passed – SEMI T 21 -0212 was published • Doc. 4847 A, New Standard: Specification for Traceability by Self Authentication Service Body and Authentication Service Body – Passed – SEMI T 22 -0212 was published <Month> <Year> <Region> <Committee> 6
New TFOF/SNARF • Japan PV Traceability TF was set up. <Month> <Year> <Region> <Committee> 7
Upcoming Ballot • Cycle 2 – Doc. 5361, Reapproval of SEMI T 17 -0706, Specification of Substrate Traceability • Developed by the 5 YR TF – Doc. 5362, Reapproval of SEMI T 18 -1106, Specification of Parts and Components Traceability • Developed by the 5 YR TF – Doc. 5365 Line Item Revision to SEMI T 15 -0705, General Specification of Jig ID: Concept • Developed by the JIG and Unit Package ID TF – Doc. 5383, Revision to Add a New Subordinate Standard Specification for Reduce Space Marking of Product Packages to SEMI G 83 -0308, Specification for Bar Code Marking of Product Packages • Developed by the JIG and Unit Packaging ID TF • Ballot Adjudication – Those ballot documents will be adjudicated in the next Japan Traceability Committee on 1 November, 2011. <Month> <Year> <Region> <Committee> 8
Device Marking Task Force • Co-leaders – Yoichi Iga (Renesas Electronics) – Hirokazu Tsunobuchi (KEYENCE) • Current activity – None <Month> <Year> <Region> <Committee> 9
Device Security Task Force • Co-leaders – Yoichi Iga (Renesas Electronics) – Andy Ohwada (Adem) – Hirokazu Tsunobuchi (KEYENCE) • Current activity – None <Month> <Year> <Region> <Committee> 10
Japan Anti-Counterfeiting Task Force • Co-leaders – Yoichi Iga (Renesas Electronics) – Andy Ohwada (Adem) – Hirokazu tsunobuchi (KEYENCE) • Current activity – Support to Int’l Anti-Counterfeiting TF – No SNARF <Month> <Year> <Region> <Committee> 11
JIG and Unite Package ID Task Force • Leader – Hirokazu tsunobuchi (KEYENCE) • Current activity – Doc. 5365 Line Item Revision to SEMI T 15 -0705, General Specification of Jig ID: Concept – Doc. 5383, Revision to Add a New Subordinate Standard Specification for Reduce Space Marking of Product Packages to SEMI G 83 -0308, Specification for Bar Code Marking of Product Packages <Month> <Year> <Region> <Committee> 12
5 years review Task Force • Leader – Hirokazu tsunobuchi (KEYENCE) • Current activity – Doc. 5361, Reapproval of SEMI T 17 -0706, Specification of Substrate Traceability – Doc. 5362, Reapproval of SEMI T 18 -1106, Specification of Parts and Components Traceability <Month> <Year> <Region> <Committee> 13
Japan PV Traceability TF • Co-leaders – Yoichi Iga (Renesas Electronics) – Hirokazu Tsunobuchi (KEYENCE) • Charter – The objective is to define and elaborate several standards to unify PV traceability from the sliced wafer to the end of PV cell life－cycle. • Scope – The activities of the task force will result in the development of several industry standards where equipment suppliers, cell manufacturers, PV module manufacturers, PV users and other involved parties can find conformity, in any technical field of PV traceability. Initial work will focus on • • Marking of ID to identify a product Means to identify as a right product Security countermeasure to realize other Traceability depending on need Anti-Counterfeiting • Kick-off Meeting – On 26 April 2012 at SEMI Japan, Tokyo, Japan <Month> <Year> <Region> <Committee> 14
Regional Staff Contact Information Name Hiro’fumi Kanno E-mail hkanno@semi. org Phone +81. 3. 3222. 6018 Office Address Committees In charge <Month> <Year> 4 -7 -15 Kudan-minami, Chiyoda-ku, Tokyo 102 -0074 Japan Traceability Committee <Region> <Committee> 15
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