Increasing Throughput in Component Manufacturing Agenda

Increasing Throughput in Component Manufacturing

Agenda

What Is Involved In Testing

Identify Where are You Spending Your Test Time

Agenda

Test Procedure Design Issues

Test Procedure Optimization

Agenda

Test Program

View Four Parameters Simultaneously

Internal Automation

Agenda

Interfacing Instruments to the Outside World

The Advantages of Using the LAN

Improving Data Transfer Speed

Agenda

Maximizing Capabilities

The Basics of Increasing Network Analyzer Sweep Speed

Select the Narrowest Frequency Range Needed

Choose the Minimum Number of Measurement Points Necessary

Use the Widest IF Bandwidth Possible

Measuring High-Rejection Devices

IF Bandwidth, Averaging & Dynamic Range

Source Power & Dynamic Range

Special Test Sets Designed to Speed Measurement of High-Rejection Devices

Special Test Sets Designed to Speed Measurement of High-Rejection Devices

Alternate Sweep Mode for More Dynamic Range

Enhanced Sweep Features

Agenda

Tuning is More Difficult on Slower Analyzers

Use Fast Two-Port Mode to “Speed Up” Slower Analyzers

Time Domain Filter Tuning

Time Domain Filter Tuning (Cont'd)

Automated Tuning

Agenda

Reducing Connection Time

Multiport Components

Manual Testing of Multiport Devices

Using RF Switching to Test Multiport Devices

Multiport Test Sets with ‘Test Set Cal’ and ‘Self. Cal’

Test Set Cal Eliminates Redundant Connections of Calibration Standards

Test Set Cal Limitations

Agilent Multiport Solutions (> 3 GHz)

A Full 4 -Port Calibration Solution from ATN Microwave

Agenda

What is Meant by Uncertainty?

Why Worry about Uncertainty?

Tradeoffs Between Throughput and Uncertainty

What is Calibration?

Vector Error Correction

Summary of Calibration Types

Agilent Uncertainty Calculator

Calibration vs. Accuracy vs. Speed

Increasing Throughput When Full Two. Port Calibration is Necessary

Using Electronic Calibration to Reduce Calibration Time

Agenda

Traditional Design Process

Circuit Design Cycle

The Disadvantage of Optimizing for Performance

Optimization Goals: Performance vs. Yield

Yield Analysis Using EDA Tools

Design Response as Several Parts Vary

Design Centering

Design Response After Design Centering

Sensitivity Histogram After Design Centering

Agenda

Increasing Throughput in Component Manufacturing

Agilent Technologies

Agenda

Characterizing RF and Microwave Devices

S-Parameters

Measuring S-Parameters

How S-Parameters Relate to Common Measurement Terms

A Typical Network Analyzer Measurement

Measuring Nonlinear Behavior

Power Sweep - Compression

Power Sweep -Gain Compression

AM to PM Conversion

Power Sweep - AM to PM Conversion

Simplified Network Analyzer Block Diagram

Source

Signal Separation

Detector Types

Broadband Diode Detection

Narrowband Detection - Tuned Receiver

T/R Versus S-Parameter Test Sets

Processor / Display

Processor / Display

Systematic Measurement Errors

Types of Error Correction

What is Vector-Error Correction?

Errors and Calibration Standards

Calibration Summary

Crosstalk (Isolation)

ECal: Electronic Calibration (Agilent 85060 series)

How Adapters Affect Uncertainty

Swap Equal Adapters Calibration

Adapter-Removal Calibration

Agenda

Agenda