Скачать презентацию Ericsson meets SMID Agenda About Authors Скачать презентацию Ericsson meets SMID Agenda About Authors

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Ericsson meets SMID Ericsson meets SMID

Agenda Agenda

About Authors 1/2 About Authors 1/2

About Authors 2/2 About Authors 2/2

One century History: Marconi & Ericsson One century History: Marconi & Ericsson

Our History Our History

THe Ericsson Acquisition THe Ericsson Acquisition

Ericsson in Ital. Y Ericsson in Ital. Y

R&D Italy WORLDWIDE ECOSYSTEM R&D Italy WORLDWIDE ECOSYSTEM

The R&D LABS in Italy (since 1975) The R&D LABS in Italy (since 1975)

cooperation with universities and research centers Nor. TH Cent. ER SOUTH • Milan-Politecnico • cooperation with universities and research centers Nor. TH Cent. ER SOUTH • Milan-Politecnico • torin-politecnico • Bologna UNIVERSITY • genova UNIVERSITY • Trento UNIVERSITY • Sant’Anna SCHOOL • CNR • CNIT • pisa UNIVERSITY • Co. Ri. Te. L • ROME UNIVERSITIES • Naples UNIVERSITY • Salerno UNIVERSITY • sannio UNIVERSITY

SESSION 1 MANUFACTURING: HOW IT WORKS SESSION 1 MANUFACTURING: HOW IT WORKS

How telecoms networks work How telecoms networks work

Equipments, chassis and cards Equipments, chassis and cards

Equipments, chassis and cards Equipments, chassis and cards

Design Fundamentals Design Fundamentals

Boards Production Flow Boards Production Flow

SMT – Line SMT – Line

SMT – Solder Paste SMT – Solder Paste

SMT – Pick and Place SMT – Pick and Place

SMT – Pick and Place Reels SMT – Pick and Place Reels

SMT – Pick and Place Top Side SMT – Pick and Place Top Side

SMT – Soldering (Owen) SMT – Soldering (Owen)

TEST IN MANUFACTURING TEST IN MANUFACTURING

Xray Xray

Complexity index calculation Complexity index calculation

X-Ray – Pictures X-Ray – Pictures

X-Ray – Pictures 2 X-Ray – Pictures 2

X-Ray – Pictures 3 X-Ray – Pictures 3

AOI - Automated Optical Inspection AOI - Automated Optical Inspection

ICT (In Circuit Test) ICT (In Circuit Test)

ICT – Bed of Nails ICT – Bed of Nails

ICT (In Circuit Test) ICT (In Circuit Test)

Functional traffic test structure Functional traffic test structure

Functional Test philosophy Functional Test philosophy

PART 2 USAGE OF STATISTICAL TOOLS IN MANUFACTURING PART 2 USAGE OF STATISTICAL TOOLS IN MANUFACTURING

Definitions Yield = Pass / Trials p(d) = (1 - Yield)/100 Definitions Yield = Pass / Trials p(d) = (1 - Yield)/100

Definitions/2 Definitions/2

Defects per units and yields Defects per units and yields

Yields versus DPMO Yields versus DPMO

Test strategy and test overlap Test strategy and test overlap

Chinese watch Syndrome Chinese watch Syndrome

Defects Defects

Defect levels vs. test coverages Defect levels vs. test coverages

Combine test techniques Combine test techniques

Weighted Coverage Weighted Coverage

Basic method of defect analysis Basic method of defect analysis

Defect Coverage Defect Coverage

Complete procedure for 1 test step Complete procedure for 1 test step

Complete analysis for 2 test steps Complete analysis for 2 test steps