Ericsson meets SMID Agenda About Authors

Ericsson meets SMID

Agenda

About Authors 1/2

About Authors 2/2

One century History: Marconi & Ericsson

Our History

THe Ericsson Acquisition

Ericsson in Ital. Y

R&D Italy WORLDWIDE ECOSYSTEM

The R&D LABS in Italy (since 1975)

cooperation with universities and research centers Nor. TH Cent. ER SOUTH • Milan-Politecnico • torin-politecnico • Bologna UNIVERSITY • genova UNIVERSITY • Trento UNIVERSITY • Sant’Anna SCHOOL • CNR • CNIT • pisa UNIVERSITY • Co. Ri. Te. L • ROME UNIVERSITIES • Naples UNIVERSITY • Salerno UNIVERSITY • sannio UNIVERSITY

SESSION 1 MANUFACTURING: HOW IT WORKS

How telecoms networks work

Equipments, chassis and cards

Equipments, chassis and cards

Design Fundamentals

Boards Production Flow

SMT – Line

SMT – Solder Paste

SMT – Pick and Place

SMT – Pick and Place Reels

SMT – Pick and Place Top Side

SMT – Soldering (Owen)

TEST IN MANUFACTURING

Xray

Complexity index calculation

X-Ray – Pictures

X-Ray – Pictures 2

X-Ray – Pictures 3

AOI - Automated Optical Inspection

ICT (In Circuit Test)

ICT – Bed of Nails

ICT (In Circuit Test)

Functional traffic test structure

Functional Test philosophy

PART 2 USAGE OF STATISTICAL TOOLS IN MANUFACTURING

Definitions Yield = Pass / Trials p(d) = (1 - Yield)/100

Definitions/2

Defects per units and yields

Yields versus DPMO

Test strategy and test overlap

Chinese watch Syndrome

Defects

Defect levels vs. test coverages

Combine test techniques

Weighted Coverage

Basic method of defect analysis

Defect Coverage

Complete procedure for 1 test step

Complete analysis for 2 test steps