Ericsson meets SMID
Agenda
About Authors 1/2
About Authors 2/2
One century History: Marconi & Ericsson
Our History
THe Ericsson Acquisition
Ericsson in Ital. Y
R&D Italy WORLDWIDE ECOSYSTEM
The R&D LABS in Italy (since 1975)
cooperation with universities and research centers Nor. TH Cent. ER SOUTH • Milan-Politecnico • torin-politecnico • Bologna UNIVERSITY • genova UNIVERSITY • Trento UNIVERSITY • Sant’Anna SCHOOL • CNR • CNIT • pisa UNIVERSITY • Co. Ri. Te. L • ROME UNIVERSITIES • Naples UNIVERSITY • Salerno UNIVERSITY • sannio UNIVERSITY
SESSION 1 MANUFACTURING: HOW IT WORKS
How telecoms networks work
Equipments, chassis and cards
Equipments, chassis and cards
Design Fundamentals
Boards Production Flow
SMT – Line
SMT – Solder Paste
SMT – Pick and Place
SMT – Pick and Place Reels
SMT – Pick and Place Top Side
SMT – Soldering (Owen)
TEST IN MANUFACTURING
Xray
Complexity index calculation
X-Ray – Pictures
X-Ray – Pictures 2
X-Ray – Pictures 3
AOI - Automated Optical Inspection
ICT (In Circuit Test)
ICT – Bed of Nails
ICT (In Circuit Test)
Functional traffic test structure
Functional Test philosophy
PART 2 USAGE OF STATISTICAL TOOLS IN MANUFACTURING
Definitions Yield = Pass / Trials p(d) = (1 - Yield)/100
Definitions/2
Defects per units and yields
Yields versus DPMO
Test strategy and test overlap
Chinese watch Syndrome
Defects
Defect levels vs. test coverages
Combine test techniques
Weighted Coverage
Basic method of defect analysis
Defect Coverage
Complete procedure for 1 test step
Complete analysis for 2 test steps
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