Diagnostic of Ultra High Brightness Electron Beams Mikhail Krasilnikov (DESY) for the PITZ Team Content: • High brightness electron beam diagnostic overview • longitudinal • transverse • slice • Photo Injector Test facility at DESY in Zeuthen (PITZ) • setup • electron beam diagnostic at PITZ • Emittance measurements at PITZ • single slit scan technique • recent results • Summary Ultra Bright Electron Sources Workshop, 29 June – 1 July 2011 The Cockcroft Institute, Daresbury
Diagnostic of High Brightness Electron Beams HB E-beam diagnostic General: • bunch charge FC, ICT, Toroids • transverse position BPM: button, stripline, cavity • arrival time (phase) BAM, RF pickups Challenges • high charge / charge density • small beam dimensions (100… 50 um nm!) • high repetition rate • all the intercepting devices are damaged by measured beams • beam halo measurements Projected Transverse profile Proj. emittance, transv. phase space Slice Longitudinal (temporal) Energy distribution Long. phase space Current profile Slice energy spread Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 2 Slice emittance
Longitudinal Parameters Measurements > Temporal beam profile (bunch length) r(t) Radiator + Streakcamera Intercepting diagnostic • Radiators • OTR (Al foil) • Cherenkov (aerogel) • Streak camera • T-resolution limited to 200. . . 300 fs • Rather expensive • Light collection transport dispersion free beam line is needed (reflective optic instead of lens) RF deflector Frequency Domain Optical and laser techniques Coherent radiations + Interferometer Time Domain Electro Optical Sampling = EOS Transition = CTR Diffraction = CDR Synchrotron CSR Smith-Parcell Cherenkov • Non intercepting and not disturbing • Based on optical properties of a non-linear crystal interacting with Coulomb field of e-beam Laser Wire • Non intercepting and not disturbing • Multi shot • Complicated setup • Interferometers (Michelson; Martin-Puplett) • Spectrum acceptance is restricted can impact the reconstructed beam profile • Guess distribution is needed Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 3
Longitudinal Parameters Measurements: RFD (TD) Map time (longitudinal) axis onto transverse coordinate RFD: • Self calibration (cavity phasing) • Single shot • Intercepting diagnostic • Resolution down to tens of fs (f, V, str) • small transverse beam size and large beta function • uncorrelated transverse energy spread • induced slice energy spread • phase jitter of the beam w. r. t. RFD OTR beam images in the LCLS injector at 135 Me. V for a 800 um long bunch with the deflecting cavity off (left) and on at 1 MV (right). H. Loos, “Longitudinal diagnostics for short electron beam bunches”, SLAC-PUB-14120 Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 4
Longitudinal phase space measurements > Spectrometer dipole ┴ RFD (Energy scale from beam in spectrometer, time scale with transverse deflector) Imaging of longitudinal phase space with RF deflector SPARC: 145 Me. V LCLS: 135 Me. V t E Fast single shot measurements Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 5
Transverse Parameters Measurements Usually the largest error in transverse parameters measurements is coming from transverse profile and rms size determination > OTR monitors (~um Al foil) § § Read out: High energy (>tens of Me. V) • Zoom optics No saturation Resolution limit closed to optical diffraction limit (~10 um) COTR effects (especially for compressed bunches) > Scintillator screens (e. g. YAG: CE, 100 um) § High photon yield § Resolution grain dimensions (~50 um? ) (powder / thin crystal) § Saturation (0. 04 p. C/um^2? ) • CCD camera • 12 bit • l~ 1 um. . 400 nm • controllable iris • Insertable filters > Wire Scanner (good agreement with YAG measurements!) § § § Almost non-invasive Higher beam power Multi-shot measurements 1 D Rather complicated setup, long measurement time > IPM (residual gas monitor) > CVD (diamond screen) long pulse train > “Indirect” (SR – Optical Synchrotron Interferometry, Scattering, ODR, etc) Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 6
Transverse Phase Space (Emittance) Measurements Emittance dominated Space charge dominated Slit mask techniques: • based on conversion of a space charge dominated beam into emittance dominated beamlets • Multi screen: • Based on linear beam matrix approach • 3 beam size measurements (at 3 positions) are needed for the known elements of the transport matrix (phase advance) • Quad(s) scan • Beam size measurements as a function of varied transport matrix • Tomography • Related to Radon theorem: Ndim object reconstruction from M projections in (N-1) dim space • Systematic error from quad strength determination (e. g hysteresis) • Thin lens model is not adequate • Large energy spread chromatic effects • Phase space distribution assumed to be homogeneous CSR (undulator) based? Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 7
Slit technique - general Emittance dominated beamlets Multi slit mask = single shot measurement, but: • Overlapping of beamlets when optimized for high resolution • Low sampling of the phase space Space charge dominated beam Transverse phase space reconstruction • Slit mask: • Opening: small enough (sc em) • Thickness: thick enough to scatter beam, but alignment / angle acceptance • Distance L: • Long enough divergence resolution • Not too long signal-to-noise L SPARC e-meter = phase space measurements along the beam line Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 8
Phase Space Tomography (e. g. at PITZ) Position of reconstruction RFD 15. 32 14. 56 13. 8 13. 04 12. 28 z > The most used technique quadrupole(s) scan, but it yields only Twiss parameters and emittance, not the phase space. Therefore phase space tomography § Back projection § Filtered Back projection § Algebraic reconstruction technique (ART) § Maximum entropy (MENT) Courtesy G. Asova (PITZ) Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 9
Slice parameters measurements > Slice emittance: § RFD + Quad(s) scan § Acc off-crest + dipole > Slice energy spread § RFD + dipole P. Emma, A. Brachmann, D. Dowell, et al. , SLAC, “Beam Brightness Measurements in the LCLS Injector”, Compact X-Ray FELs using High-Brightness Beams, 5 -6. 08. 2010, LBNL 1 2 3 Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 10
Photo Injector Test facility at DESY in Zeuthen The Photo Injector Test facility at DESY in Zeuthen (PITZ) focuses on the development, test and optimization of high brightness electron sources for superconducting linac driven FELs: test-bed for FEL injectors: FLASH, the European XFEL small transverse emittance (~1 mm mrad @ 1 n. C) stable production of short bunches with small energy spread further studies: dark current, QE, thermal emittance, … + detailed comparison with simulations = benchmarking of photo injector physics extensive R&D on photo injectors and test of new developments (laser, cathodes, beam diagnostics) Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 11
XFEL Photo Injector Key Parameters to be tested at PITZ subsystem parameter value remarks 1. 3 GHz E-field at cathode 60 MV/m dark current issue RF pulse duration 700 us max Repetition rate RF gun cavity frequency 10 Hz max Temporal –> flat top –> FWHM 20 ps Temporal –> flat top –> rise/fal time 2 ps challenge 20 ps Cathode laser 0. 3 -0. 4 mm fine tuning -> thermal emittance Pulse train length 650 us max Bunch spacing 222 ns (4. 5 MHz) 1 us (1 MHz) at PITZ now Repetition rate 10 Hz max Bunch charge Electron beam Transverse – rad. homogen. XYrms 1 n. C other charges under consideration Projected emittance at injector 0. 9 mm mrad Bunch peak current 5 k. A Emittance (slice) at undulator 1. 4 mm mrad after bunch compression (not at PITZ) Main efforts at PITZ towards XFEL photo injector Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 12
Beam diagnostics at PITZ Diagnostics for Transverse phase space and Longitudinal phase space <25 Me. V Component OSS, streak-camera transverse distribution Virtual cathodes, CCD cameras pulse energy Energy-meter, PMT position stability Quadrant-diode bunch charge Faraday cups, Integrating current transformers beam position BPMs longitudinal momentum Electron beam Diagnostics temporal profile Cathode laser Property Dipoles+ dispersive arms (LEDA, HEDA 1, 2) transverse distribution transverse phase space (emittance) longitudinal profile <7 Me. V YAG and OTR screens with CCD cameras longitudinal phase space slice emittance Slit masks (EMSY 1, 2, 3), quadrupoles, tomography module Radiators (straight section) + streak read-out, upcoming – Transverse Deflecting Cavity Radiators (dispersive arms) + streak read-out, upcoming Transverse Deflecting System (TDS)+HEDA 2 (slice energy spread) HEDA with booster off-crest, upcoming TDS+HEDA 2 Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 13
Slit scan technique at PITZ: evolution > ~2002 -2003 rough divergence estimation using center beamlet, 8 bit camera > 2003 -2005 sheared emittance estimation using 3 slit positions (0; +/0. 7*sigma. X), 8 -bit camera > 2005 -2008 – standard “manual” slit scan (~200 um step) phase space reconstruction, 12 -bit camera > 2009 -2011 – automated synchronized slit scan with adjustable scan speed phase space “on-line”, 12 -bit cameras, zoom option, scale procedure The emittance measurement procedure at PITZ: • under permanent improvement in terms of resolution and sensitivity • as conservative as possible (100% rms emittance)! !NB: measured emittance numbers are permanently reducing as a result of machine upgrades and extensive optimization of beam parameters “we are measuring more and more of less and less…” Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 14
Transverse projected emittance measurements at PITZ beam at EMSY screen Single slit scan technique transverse phase space > Emittance Measurement SYstem (EMSY) consists of horizontal / vertical actuators with § YAG / OTR screens § 10 / 50 m slits > Beam size is measured @ slit position using screen > Beam local divergence is estimated from beamlet sizes @ observation screen > 12 -bit camera, quality criteria: max bit>3000 (from 4095=2^12 -1); adjustment = gain X No. P > Image filtering (3 sigma, bkg, x-ray, MOI) 2 D scaled normalized RMS emittance scale factor ( >1 ) introduced to correct for low intensity losses from beamlet measurements 2. 64 m Observation screen EMSY 1 (z = 5. 74 m) x - RMS beam size measured with YAG screen at slit location SQRT(<x 2>) - RMS beam size at slit location estimated from slit positions and beamlet intensities “ 100% RMS emittance” Statistics over all pixels in all beamlets Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 15 pixel intensity
Slit scan technique at PITZ: how it works now > Setup the machine § laser temporal and transverse § laser BBA at the cathode § gun phase § bunch charge § booster phase and gradient – beam energy (longitudinal momentum) > For a chosen main solenoid current (bucking in compensation) § Beam transverse distribution (rms size) at EMSY 12 -bit camera!; frames=50 x. Signal+50 x. Bkg (laser shutter closed) with adjusted camera gain G and No. P § Beam transverse distribution at beamlet collection screen for MOI 12 -bit camera! frames=50 x. Signal+50 x. Bkg (laser shutter closed) with adjusted camera gain G and No. P § Slit scan (typical speed 0. 1 -0. 5 mm/sec) with simultaneous beamlet image taking. Synchronization of the slit position and the frame acquisition (10 Hz!) with adjusted camera gain G and No. P § Slit scan with closed laser shutter for the average bkg calculation > Transverse phase space reconstruction and emittance calculations § Phase space linear shift to take the slit position into account § Scale procedure > Error analysis (systematic and statistics – e. g. 3 x 5) Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 16
Emittance measurements at PITZ (typical solenoid scan) Machine setup (07. 05. 2011 M): BSA=1. 2 mm; gun=6 deg off crest; 1 n. C; re p booster=on-crest limin ary Beam momentum after the gun Laser temporal profile Bunch charge tuning Laser transverse distribution Beam momentum after the booster Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 17
Emittance measurements at PITZ: typical solenoid scan 2) 3 x 3 statistics for the bes solenoid current pre 1) Solenoid scan for X and Y emittance limin ary beam at EMSY: 3 x 1 XPx: 3 x 3 07. 05. 2011 M: sol. scan: Xemit | Yemit | XYemit 0. 778 | 0. 701 | 0. 738 07. 05. 2011 M: 3 x 3 stat: Xemit=(0. 742± 0. 021 stat) mm mrad Yemit=(0. 782 ± 0. 028 stat) mm mrad XYemit=(0. 761± 0. 017 stat) mm mrad Geometrical averaged emittance: Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 18 YPy: 3 x 3
PITZ setup: now and upgrades during this year <7 Me. V <25 Me. V beam dump HEDA 2 together with TDS: measure slice momentum spread down to 1 ke. V/c Transverse Deflecting Structure (TDS) time resolved measurements DISP 3. Scr 2 electron beam DISP 3. Scr 1 Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 19
Summary > High brightness electron beams require particular diagnostic for longitudinal and transverse phase space characterization: § Strong energy dependency (YAG for low energies, OTR – for high energies) § Non-invasive techniques are highly desirable § Slice parameters measurements are important > The main focus at PITZ small emittance electron beams. To reach this: § high gun gradients § cathode laser transverse and temporal shaping § machine stability § extensive machine optimization > Emittance measurement procedure § nominal method single slit scan § as conservative as possible 100% rms emittance § continuous improvement of the procedure > PITZ sets a benchmark for ultra high brightness electron sources: § specs for the European XFEL have been met (emittance <0. 9 mm mrad at 1 n. C) and even surpassed § beam emittance has also been optimized for a wide range of bunch charges (20 pc… 2 n. C) § rather high duty factor (average power, long pulse trains) in stable operation Mikhail Krasilnikov | Diagnostic of Ultra High Brightness Electron Beams | 30. 06. 2011 | Page 20
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