Скачать презентацию Tracker construction in Italy SSD testing Ladder qualification Скачать презентацию Tracker construction in Italy SSD testing Ladder qualification

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Tracker construction in Italy SSD testing Ladder qualification Luca Latronico Italian collaboration Meeting - Tracker construction in Italy SSD testing Ladder qualification Luca Latronico Italian collaboration Meeting - Pisa 18/02/2002 INFN-Pisa

Tracker construction roadmap Tower Structure (walls, fasteners) Engineering: SLAC, Hytec Procurement: SLAC SSD Procurement, Tracker construction roadmap Tower Structure (walls, fasteners) Engineering: SLAC, Hytec Procurement: SLAC SSD Procurement, Testing Japan, Italy, SLAC Tower Assembly and Test SLAC (2) Italy (16) SSD Ladder Assembly Italy 10, 368 2592 Tray Assembly and Test Italy 342 18 Cable Plant UCSC Electronics Design, Fabrication & Test UCSC, SLAC 648 Composite Panel & Converters Engineering: SLAC, Hytec, and Italy Procurement: Italy INFN-Pisa

SSD in the house 1903 SSDs (>18% of total) received so far from HPK SSD in the house 1903 SSDs (>18% of total) received so far from HPK provides: • at batch level - from an SSD taken at sample in the batch, min, max, avg values of the following: ü strip bias resistor ü strip coupling capacitance ü strip resistance • at single SSD level: ü IV scan 0 -200 V (Ileak is I measured at 150 V) ü CV scan 0 -200 V (Cbulk is C at 150 V) ü Vdep – defined as V where F(V) - F(V-5) < 0. 0039, with F=1/C 2[n. F] ü bad strips ID and defect type INFN-Pisa

HPK data statistics Ileak specs: I < 600 n. A single SSD I < HPK data statistics Ileak specs: I < 600 n. A single SSD I < 200 n. A averaged on 100 SSD Stdev(Cbulk) ~ 2 mm all within specification INFN-Pisa

HPK data statistics INFN-Pisa HPK data statistics INFN-Pisa

HPK data statistics: defects analysis INFN-Pisa HPK data statistics: defects analysis INFN-Pisa

HPK data statistics: defects analysis INFN-Pisa HPK data statistics: defects analysis INFN-Pisa

Laboratory measurements – tests rate dimensional electrical partially test fully tested 590 390 637 Laboratory measurements – tests rate dimensional electrical partially test fully tested 590 390 637 341 updated friday 15/02 … but we had some activity during the week-end ~1. 5 months stop for clean room failure maximum speed reached last month: ü 16 min/SSD for IV-CV scan ü 6 min/SSD for dimensional test ü but we keep the pace only with training! INFN-Pisa

Laboratory measurements enthusiastic students at work took dimensional test as video game INFN-Pisa Laboratory measurements enthusiastic students at work took dimensional test as video game INFN-Pisa

SSD Pisa clean room measurements see www. pi. infn. it/glast/lattd/ssd_insp_proc. doc (LAT-TD-00454) Electrical • SSD Pisa clean room measurements see www. pi. infn. it/glast/lattd/ssd_insp_proc. doc (LAT-TD-00454) Electrical • strips (p+) grounded / back plane (n) at variable V(+) • use calibrated instrumentations (Vsource, p-ammeter, LCR) • read through GPIB/Lab. View • data can upload DB automatically IV scan 0 -200 V Ileak at 150 V CV scan 0 -200 V Cbulk at 150 V Vdep with: 2 fit intersection HPK definition INFN-Pisa

Laboratory vs HPK data INFN-Pisa Laboratory vs HPK data INFN-Pisa

Laboratory vs HPK data INFN-Pisa Laboratory vs HPK data INFN-Pisa

Laboratory vs HPK data INFN-Pisa Laboratory vs HPK data INFN-Pisa

SSD dimensional tests see www. pi. infn. it/glast/lattd/ssd_insp_proc. doc (LAT-TD-00454) Geometrical • pixel/mm calibration SSD dimensional tests see www. pi. infn. it/glast/lattd/ssd_insp_proc. doc (LAT-TD-00454) Geometrical • pixel/mm calibration on reference cross • measure distance of reference cross centre to X and Y edge (all corners, DXA, DYA, DXB…) • cut alignment evaluated with: Shift= (Dy. A+Dy. D)/2 Rotation=Dy. A-Dy. D INFN-Pisa

SSD dimensional tests INFN-Pisa SSD dimensional tests INFN-Pisa

SSD non-conformancies analysis • assign acceptance flag after each test (soon LAT-TD doc) • SSD non-conformancies analysis • assign acceptance flag after each test (soon LAT-TD doc) • periodic review • failure to be published within 24 hrs OK warning failure 42 non-conformancies so far - 28 left after review 25(7%) warning - 3(<1%) failures INFN-Pisa

Ladders qualification see www. pi. infn. it/glast/lattd/lad_ass_meas. doc (soon LAT-TD … ) Currently qualifying Ladders qualification see www. pi. infn. it/glast/lattd/lad_ass_meas. doc (soon LAT-TD … ) Currently qualifying two suppliers ü G&A Engineering ü MIPOT Ladders assembled with flight sensors and final tools Alignment Glueing INFN-Pisa

Ladders qualification: mechanics SSD alignment check (G&A) INFN-Pisa Ladders qualification: mechanics SSD alignment check (G&A) INFN-Pisa

Ladders qualification: mechanics • bonding pull strength between 6 -9 gr. (measured at Mipot) Ladders qualification: mechanics • bonding pull strength between 6 -9 gr. (measured at Mipot) • bonding encapsulation (at G&A and Mipot): pure epoxy (3 M Scotchweld 2216 A/B) dam (3 M Scotchweld 2216 A/B ) + fill (General Electric 615 ) both good but dam&fill chosen as more reliable INFN-Pisa

Ladders qualification: leakage current G&A Mipot (Dam&Fill encapsulation) INFN-Pisa Ladders qualification: leakage current G&A Mipot (Dam&Fill encapsulation) INFN-Pisa

Ladders qualification: leakage current Mipot (Dam&Fill encapsulation) little current increase after ladder assembly and Ladders qualification: leakage current Mipot (Dam&Fill encapsulation) little current increase after ladder assembly and microbonding encapsulation good stability (2 days) INFN-Pisa

Ladders qualification: bulk capacitnace • ladder bulk capacitance = 7. 34 n. F Ø Ladders qualification: bulk capacitnace • ladder bulk capacitance = 7. 34 n. F Ø equivalent to sum Cbulk of 4 SSDs • depletion voltage = 55 Volt Ø same as 4 SSDs INFN-Pisa

Conclusions • Flight sensors testing proceeds at full speed : Ø goes on everyday Conclusions • Flight sensors testing proceeds at full speed : Ø goes on everyday for 8 hrs. (electrical) + 4 hrs. (geometrical) Ø primary activity of the whole italian collaboration Ø contributions from people belonging to other italian institutions Ø other test centre are now warming up around Italy Ø will increase contacts Ø need to improve DB in order to share data with new test centres and suppliers • Ladder qualification: Ø two manufacturers involved in the process Ø both were qualified Ø basic tests/choices done Ø ready to start mass production INFN-Pisa